XIV International Conference on pulsed lasers and laser applications – AMPL-2019
September 15-20, 2019, Tomsk
Participant Organizations
Organization: Technical University of Munich, Garching, Germany
List of reports:
- Hampf, Raphael, Ulrich, Andreas, Wieser, Jochen
Optical ion beam profile determination using emission from neutral and ionic argon, neon, and nitrogen transitions
- Hampf, Raphael, Ulrich, Andreas, Wieser, Jochen
Pressure dependent effective emission cross sections of the neutral and ionic Argon 4p-4s and Neon 3p-3s transitions for heavy ion excitation
- R. Hampf, A. Ulrich, J. Wieser
Absolut sensitivity calibration of a lens - CCD-camera optical system
- A. Ulrich
Optical diagnosis of intense ion beams
- A. Ulrich
The scintillation of liquid Ar-Xe mixtures
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